Rare Earth Elements (REEs) are seldom distributed evenly within an ore body. They occur in discrete, often refractory mineral phases where crystal structure and particle size directly influence analytical response. Conventional pressed powder pellets prepared from finely ground ore samples can struggle to represent this heterogeneity, introducing mineralogical and particle-size bias into X-ray fluorescence (XRF) data used for grade control and metallurgical planning. Across the rare earth value chain, incremental recovery gains depend on removing this analytical uncertainty. Fusion-based XRF sample preparation dissolves the mineral lattice into a homogeneous glass bead, delivering precision and comparability that enable tighter process control, improved recovery forecasting, and more ac

Global copper demand is rising, driven by electrification, grid storage, and renewable infrastructure. However, the copper being processed is increasingly variable, reflecting deeper deposits, blended feeds, and more complex mineral chemistry. Copper analysis now carries strategic weight within mining operations because laboratory data defines recovery targets, concentrate specifications, and financial reconciliation models. As feed composition shifts, analytical variability can propagate directly into production forecasts and revenue calculations, particularly when matrix effects modify the measured copper fluorescence intensity in X-ray fluorescence (XRF) analysis. To address distortion of copper signal intensity caused by absorption and secondary enhancement effects associated

In X-ray fluorescence (XRF) analysis, achieving reliable limits of detection and quantification is strongly influenced by effective control of contamination during sample pelletising. While modern XRF spectrometers offer exceptional stability and resolution, their performance can be undermined long before analysis begins if sample preparation is poorly controlled. Trace contaminants introduced during pelletising can elevate background signals, distort peak intensities, or obscure low-level analytes entirely. For this reason, contamination control must be treated as an integral part of the XRF sample preparation workflow, with consistent, technically grounded controls applied at each stage.

Defining Primary Sources of Contamination

Several distinct sources acco

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